Software Library API naibrd 1.62
See all documentation at naii.docs.com
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Functions | |
NAIBRDFUNC nai_status_t NAIAPI | naibrd_IOCT_SetTestMode (int32_t cardIndex, int32_t module, nai_ioct_test_cmd_t testmode) |
Sets the test mode for Engineering Testing (available on PE Module only - uses Channel 2 as test points). | |
NAIBRDFUNC nai_status_t NAIAPI | naibrd_IOCT_GetTestMode (int32_t cardIndex, int32_t module, nai_ioct_test_cmd_t *outtestmode) |
Retrieves the test mode for Engineering Testing (available on PE Module only - uses Channel 2 as test points). | |
NAIBRDFUNC nai_status_t NAIAPI | naibrd_IOCT_SetTestPattern (int32_t cardIndex, int32_t module, uint32_t pattern) |
Sets the test pattern for Engineering Testing (available on PE Module only - uses Channel 2 as test points). | |
NAIBRDFUNC nai_status_t NAIAPI | naibrd_IOCT_GetTestPattern (int32_t cardIndex, int32_t module, uint32_t *outpattern) |
Retrieves the test pattern for Engineering Testing (available on PE Module only - uses Channel 2 as test points). | |
NAIBRDFUNC nai_status_t NAIAPI | naibrd_IOCT_SetTestRegister (int32_t cardIndex, int32_t module, int32_t testreg, uint32_t testval) |
Sets the value in test register for Engineering Testing (available on PE Module only - uses Channel 2 as test points). | |
NAIBRDFUNC nai_status_t NAIAPI | naibrd_IOCT_GetTestRegister (int32_t cardIndex, int32_t module, int32_t testreg, uint32_t *outtestval) |
Retrieves the value in test register for Engineering Testing (available on PE Module only - uses Channel 2 as test points). | |
NAIBRDFUNC nai_status_t NAIAPI naibrd_IOCT_GetTestMode | ( | int32_t | cardIndex, |
int32_t | module, | ||
nai_ioct_test_cmd_t * | outtestmode ) |
Retrieves the test mode for Engineering Testing (available on PE Module only - uses Channel 2 as test points).
cardIndex | : (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1). |
module | : (Input) Module Number of the module to access (1 - [max modules for board]). |
outtestmode | : (Output) Specifies the test template to use for Engineering testing. |
NAIBRDFUNC nai_status_t NAIAPI naibrd_IOCT_GetTestPattern | ( | int32_t | cardIndex, |
int32_t | module, | ||
uint32_t * | outpattern ) |
Retrieves the test pattern for Engineering Testing (available on PE Module only - uses Channel 2 as test points).
cardIndex | : (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1). |
module | : (Input) Module Number of the module to access (1 - [max modules for board]). |
outpattern | : (Output) Specifies the test pattern to use for Engineering testing. |
NAIBRDFUNC nai_status_t NAIAPI naibrd_IOCT_GetTestRegister | ( | int32_t | cardIndex, |
int32_t | module, | ||
int32_t | testreg, | ||
uint32_t * | outtestval ) |
Retrieves the value in test register for Engineering Testing (available on PE Module only - uses Channel 2 as test points).
cardIndex | : (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1). |
module | : (Input) Module Number of the module to access (1 - [max modules for board]). |
testreg | : (Input) Specifies the test register to use for Engineering testing (1 - 4). |
outtestval | : (Output) Test Value. |
NAIBRDFUNC nai_status_t NAIAPI naibrd_IOCT_SetTestMode | ( | int32_t | cardIndex, |
int32_t | module, | ||
nai_ioct_test_cmd_t | testmode ) |
Sets the test mode for Engineering Testing (available on PE Module only - uses Channel 2 as test points).
cardIndex | : (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1). |
module | : (Input) Module Number of the module to access (1 - [max modules for board]). |
testmode | : (Input) Specifies the test template to use for Engineering testing. |
NAIBRDFUNC nai_status_t NAIAPI naibrd_IOCT_SetTestPattern | ( | int32_t | cardIndex, |
int32_t | module, | ||
uint32_t | pattern ) |
Sets the test pattern for Engineering Testing (available on PE Module only - uses Channel 2 as test points).
cardIndex | : (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1). |
module | : (Input) Module Number of the module to access (1 - [max modules for board]). |
pattern | : (Input) Specifies the test pattern to use for Engineering testing. |
NAIBRDFUNC nai_status_t NAIAPI naibrd_IOCT_SetTestRegister | ( | int32_t | cardIndex, |
int32_t | module, | ||
int32_t | testreg, | ||
uint32_t | testval ) |
Sets the value in test register for Engineering Testing (available on PE Module only - uses Channel 2 as test points).
cardIndex | : (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1). |
module | : (Input) Module Number of the module to access (1 - [max modules for board]). |
testreg | : (Input) Specifies the test register to use for Engineering testing (1 - 4). |
testval | : (Input) Test Value. |